Test Probes

LD Micro Precision Sdn Bhd has achieved breakthrough in ultra fine machining process capability for the test probe used in the wafer sorting operation. Probe needles for both cantilever and vertical probe cards are produced under proprietary process(es) to ensure effective and long lasting applications.

Probe needle materials (both plated and unplated type) with diameters 0.2mm (8 mils) to 0.7mm (28 mils) range include:

• Tungsten
• Tungsten Rhenium
• Beryllium Copper
• Tungsten Carbide